FormFactor’s Autonomous Silicon Photonics Measurement Assistant sets the industry-standard in wafer and die-level silicon photonics probing. This highly flexible solution provides a multitude of testing technologies from single fibers to arrays and from vertical coupling to edge coupling. With the new revolutionary OptoVue for advanced calibrations, intelligent machine vision algorithms and the exclusive SiPh TopHat for dark, shielded and frost-free environment, the system enables hands-free autonomous calibration and re-calibration at multiple temperatures. This enables faster time to more accurate measurements and reduced cost of test.

With FormFactor’s Contact Intelligence, the operator can start a test and leave the system measuring during the whole shift, overnight or even over the weekend, without any user intervention. Probes are dynamically corrected for the most accurate pad placement on-the-fly to compensate for any thermal expansion of the probes or device when changing temperature. Contact Intelligence modules enable complete hands-free 24/7 operation using motorized probe positioners for small pad touchdown optimization, automatic testing over multiple different temperatures, and automatic probe layout spacing for testing sub dies. 

Perform True Autonomous RF and mm-Wave Measurements and Calibrations on 200mm and 300mm Probe Stations 

FormFactor introduces a new assistant for autonomous calibration and measurement of RF devices over multiple temperatures. New RF devices for applications such as 5G, autonomous driving and next generation Wi-Fi, need to have the most accurate device models for their IC designs. Normal testing of RF device modelling test structures requires large amounts of time from the engineer to perform re-calibrations whenever the system drifts beyond a usable limit. Re-positioning of the probes when changing temperature, also requires user intervention.